Krishna Dayal Shukla, Nishant Saxena, Suresh Durai, and Anbarasu Manivannan; “Redefining the Speed Limit of Phase Change Memory Revealed by Time-resolved Steep Threshold-Switching Dynamics of AgInSbTe Devices”; Scientific Reports, 6, 37868 (2016). DOI: 10.1038/srep37868. Impact factor 5.12. ISSN No. 2045-2322. 

Krishna Dayal Shukla, Smriti Sahu, Anbarasu Manivannan, and Uday Deshpandey; “Direct Evidence for a Systematic Evolution of Optical Band Gap and Local Disorder in Ag, In Doped Sb2Te Phase Change Material”; Physica Status Solidi RRL, 1700273 (2017). DOI: 10.1002/pssr.201700273. Impact factor 3.06.  ISSN No. 1862-6254. 

Krishna Dayal Shukla, Nishant Saxena, and  Anbarasu Manivannan; “An ultrafast programmable electrical tester for enabling time-resolved, sub-nanosecond switching dynamics and programming of nanoscale memory devices”;  Review of Scientific Instruments, 88, 123906 (2017); DOI: 10.1063/1.4999522. Impact factor 1.51. ISSN No. 10897623 

Rathinavelu Sengottaiyan, Nishant Saxena, Krishna Dayal Shukla, and Anbarasu Manivannan “Temperature dependent structural evolution and crystallization properties of thin Ge15Te85 film revealed by in situ resistance, x-ray diffraction and scanning electron microscopic studies”; Journal of Physics D: Applied Physics 53, 025108 (2019). DOI: 10.1088/1361-6463/ab4e6b. Impact factor 2.8. ISSN No. 0022-3727

Rathinavelu Sengottaiyan, Nishant Saxena, Krishna Dayal Shukla, and Anbarasu Manivannan, "Rapid threshold switching dynamics of co-sputtered chalcogenide Ge15Te85 device for selector application" , Semiconductor  Science and  Technology 36 015013 (2020); DOI: 10.1088/1361-6641/abc390. Impact factor 2.65. ISSN No. 13616641

Krishna Dayal Shukla, Anshul Malik, Vivek Kumar Shukla, Neha Sharma and Rajesh Kumar; "An investigation on Structural and Electronic states of Ge15Te85 material as a selector device"; International conference on Advanced Materials And Nanotechnology(AMN-2020), Jaypee Institute of Information Technology, Noida (INDIA), February 20-22, 2020.

M. Anbarasu, Krishna Dayal Shukla, and Suresh Durai; “Theoretical and Experimental Investigation of Electrical Switching Properties of AgInSbTe Phase Change Memory Devices”; Proceeding of International workshop on Physics of Semiconductor Devices (IWPSD), pp. 408, Dec 2015. Indian Institute of Science, Bangalore.

Gaurav Bishnoi, K. Harish Kumar, Krishna Dayal Shukla,  and M. Anbarasu; “LabVIEW controlled Ultrafast  Programmable Electrical Tester for Nanoscale Device Characterization”; Conference on Intelligent Robotics, Automation and Manufacturing (IRAM), pp. 82, Dec 2013. Indian Institute of Technology, Indore.

Kavita Khare and Krishna Dayal Shukla; "Design A 1Bit Low Power Full Adder Using Cadence Tool"; International Conference On Methods And Models In Science and Technology, AIP Conf. Proc. 1324, 373 (2010). DOI: 10.1063/1.3526237. (Mody Institute of Technology and Science Lakshmangarh)

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